SPAYN

Statistical Parameter and Yield Analysis

SPAYN is a statistical modeling tool for analyzing variances from model parameter extraction sequences, electrical test routines, and circuit test measurements. SPAYN helps to identify the relationship between device or circuit performance variations and the process fluctuations.

Key Features

• Automatic generation of worst-case and corner SPICE models
• Advanced principal factor / component analysis
• Identification of inter-relationship among groups of parameters
• Statistical process control, process monitor, and yield analysis
• Advanced Wafer Map displaying wafer-to-wafer and die-to-die variances
• Seamless integration with fast SmartSpice API for statistical circuit design
• Flexible data input, output, append, merge, and split options with histogram, 2D & 3D scatter plot, and response surface model display options

Rev. 101607_07