HIPEX
Full-Chip Parasitic Extraction
HIPEX is an accurate and fast full-chip hierarchical extraction software that performs extraction of parasitic capacitances and resistances from hierarchical layouts. HIPEX is tightly integrated with the Expert Layout Editor for complete design flow of DRC/LVS and RC parasitic extraction.
Key Features
- Multiple parasitic extraction models, including lumped RC, C only, R only, coupled C and fully distributed RC
- Selected net extraction for fast RC extraction of critical path nets in SoCs and large memories
- Efficient network reduction for distributed parasitic RC networks
- Output parasitic netlist files in SPICE, back-annotated netlist, DSPF and SPEF formats
- Automated back annotation enables accurate post-layout simulation and analysis
- Parasitic device extraction on both transistor and gate levels
HIPEX-NET Device Extraction
- Integrated into Expert Layout Editor
- Converters for Dracula™ technology files
- Common Graphical User Interface for Solaris, Linux and Windows platforms
- Extracts hierarchical netlist preserving original layout hierarchy for easy analysis
- Extracts MOSFET, MESFET, BJT, JFET, diode, capacitor, resistor, and parameterized user-defined devices
- Performs electrical rule checking (ERC) for shorts, opens, dangles
- Accurate parameter extraction for non-45 and non-90 degrees devices
- Efficient memory usage for handling large designs
- Available in 32 and 64 bit versions
- HIPEX-NET is not multi-threaded
Full-Chip Parasitic Extractor Product Family Design Flow
HIPEX Parasitic Capacitance Extraction
- Driven by rule-based technology file
- Back-annotates the schematic netlist with parasitic capacitors
- Striping algorithm and stripe database enables efficient parallelization for multi-processor machines
- Extracts parasitic coupling capacitors for full chip and selected nets
- Outputs SPICE capacitor netlists including detailed netlist with overlap, lateral, and fringe capacitance
- Offers different built-in capacitance models to trade off between accuracy and run time
- Uses in-built capacitance models and supports external capacitance rule files generated by EXACT for 3D accurate mode
- Extracts selected nets for fast parasitic C computation of critical paths
HIPEX Parasitic Resistance Extraction
- Driven by rule-based technology file
- Back-annotates the schematic netlist with parasitic resistors
- Extracts contact parasitic resistors
- Processes L, T, Cross and Bend resistor shapes
- Uses contact over-sizing and clustering to simplify resistor shapes.
- Extracts netlist with parasitic resistors hierarchically for full chip or selected nodes
- Builds resistance database for merging into parasitic RC netlists
- Multiple extraction models and equation solvers are used for arbitrary shape resistors
- Splits long conducting tracks for more accurate RC distribution
- Provides output of selected nodes into GDS or CIF file for layout debugging purposes
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HIPEX-C provides detailed coupling capacitor netlists for accurate analyses of overlap, lateral, and fringe capacitances. |
HIPEX supports SPICE, DSPF formats. |
HIPEX-RC Parasitic Network Distribution
- Combines extracted resistance with newly created nodes and parasitic capacitance
- Distributes capacitors over parasitic resistor bodies accurately using XY coordinates
- Uses PI model for RC network
- Results are output to SPICE and DSPF netlists
- Back-annotates schematic netlist with parasitic resistors and capacitors
HIPEX-CRC Network Reduction Tool
- Significantly reduces runtime of post-layout and post-route simulations
- Performs reduction by elimination of dangling RC elements, elimination of RC elements less than a user specified threshold, parallel/series merging and Scattering-Parameter-Based Macromodeling
- Performs networks reduction in linear time
- Handles RC networks with loops
- Preserves the same accuracy of simulation for reduced RC networks
- Supports SPICE, DSPF, or SPEF formats
- Custom reduction algorithms using LISA Scripting Language for selecting subcircuits, cells, nets and thresholds

   
Rev. 072310_22
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